xDAP 7410 Specifications
Sections: Physical  Processor  Timing  Input  Digital I/O  Input Electrical  Dynamic
Physical Characteristics
Parameter  Sym  Min  Typ  Max  Units 

Enclosure  
Length, body 


12.43 

in 
Length, body plus handles 


14.25 

in 
Width 


9.25 

in 
Height, body 


5.25 

in 
Height, body plus feet 


5.56 

in 
Weight 


11.75 

lb 
Operating temperature ^{(1)} 
T_{a} 
0 
— 
50 
°C 
External AC Power Requirements  
Supply input voltage ^{(2)} 
V_{ps} 
100 
115 
— 
V RMS 
Supply input current 
I_{ps} 

— 
6 
A RMS (115V) 
Supply input power ^{(3)} 
P_{ps} 
10 
50 
100 
W 
Supply input frequency ^{(4)} 
f_{ps} 
47 
50 
53 
Hz 
Internal DC power capacity  
Continuous ground current load capacity 



100 
mA 
Fuse rating, +5V supply 


2 


(1) Presumes adequate ventilation.
(2) The full range from 100 to 240 volts is tested.
(3) Does not include loading from added termination networks or customizations.
(4) Min and max frequency limits are the tested range, nominal value ± 6%
tolerance
Processor Module
Feature  Property 

Processor type 
Intel® Celeron 575 
Processor clock speed 
2.0 GHz 
Processor main memory 
1.0 GB 
Embedded operating system 
DAPL 3000 
Timing Characteristics
Parameter  Sym  Min  Typ  Max  Units 

Sampling interval resolution 
Δt_{s} 

20 

ns 
Sampling interval range 
t_{s} 
1.0 

10000.0 
μs 
Timing absolute accuracy ^{(1)} 

50 
— 
50 
PPM 
Sampling interval jitter 

— 
100 
— 
ps 
Acquisition latency ^{(2)} 

— 
— 
900 
ns 
(1) Oscillator is affected by temperature, supply, and longterm drift variations.
(2) Describes hardware performance only. Buffering, processing, and data transport
contribute much larger latencies.
Input Characteristics
Feature  Property 

Analog input channel type 
Differential 
Number of analogtodigital converters ^{(1)} 
8 (simultaneous) 
Maximum multiplexed analog input signals 
32 
Primary HD connector 
16 channels 
Optional BNC input panels 
8 or 16 channels 
Analogtodigital converter codes 
65536 (16 bits) 
Skipped or missing codes 
none 
Skipped or missing samples 
none 
Configurable input ranges 
7 
10 V to +10 V 
gain 1 
5 V to +5 V 
gain 2 
2 V to +2 V 
gain 5 
1 V to +1 V 
gain 10 
0.5 V to +0.5 V 
gain 20 
0.2 V to +0.2 V 
gain 50 
0.1 V to +0.1 V 
gain 100 
(1) Conversion operations on all converters are clocked simultaneously.
Digital I/O Characteristics
Parameter  Sym  Min  Typ  Max  Units 

Inputs  
Absolute input range limits 

0.5 

5.5 
V 
Operating range 
V_{i} 
0.0 

5.0 
V 
Input for levellow 
V_{iL} 


0.8 
V 
Input for levelhigh 
V_{iH} 
2.0 


V 
Input current ^{ (1) } 
I_{l} 
12 
— 
12 
μA 
Input load ^{ (1) } 
R_{i} 
— 
10 
— 
kΩ 
Input transition time ^{ (2) } 
T_{t} 


60 
ns 
Outputs  
Output voltage range 
V_{o} 
0 

3.3 
V 
Continuous output current 
I_{o} 
5 

5 
mA 
Output voltage at 5 mA load 
V_{oH} 
2.4 


V 
Output voltage at 5 mA load 
V_{oL} 


0.4 
V 
Output termination ^{ (1) } 
R_{T} 
— 
10 
— 
kΩ 
Output capacitive load ^{(3)} 
C_{L} 


200 
pF 
Unloaded switching transition time 
t_{pd} 

12 
— 
ns 
Loaded switching transition time ^{ (4) } 
t_{pdL} 

30 
— 
ns 
Output voltage source  
Output supply voltage 
V_{ss} 
— 
5.0 
— 
V 
Regulation under full load 
ΔV_{ss} 
5 

+5 
% 
Supply current 
I_{ss} 


0.5 
A 
Ground sink current 
I_{G} 


0.5 
A 
(1) The termination resistance is present at all times, and will pull voltages
to ground under unpowered conditions.
(2) Signal transitions between V_{iL} and V_{iH} levels can
go more slowly, but slower transitions could lead to uncertainty in
captured value.
(3) Excessive capacitive loading can
degrade device stability.
(4) Includes C_{L} capacitive loading in addition to termination.
Input Electrical Characteristics
Parameter  Sym  Min  Typ  Max  Units 

Input channels  
Absolute input range limits 
V_{iMax} 
35 

+35 
V 
Operating input range limits ^{(1)} 
V_{i} 
13 

+13 
V 
Input impedance 
R_{i} 
— 
20 
— 
MΩ 
Input leakage current 
I_{L} 
— 
5 
46 
nA 
Charge injection ^{(2)} 

— 
0.4 
— 
pC 
Offset error ^{(3)} 

2 
— 
2 
counts 
Offset thermal sensitivity 

— 
— 
— 
μV / °C 
Long term offset drift 

— 
— 
— 
% / yr 
Gain error ^{(3)} 

— 
— 
0.05 
% 
Gain thermal sensitivity 

— 
— 
— 
% / °C 
Long term gain drift 

— 
— 
— 
% / yr 
Slewing rate limit ^{(4)} 

— 
20 
— 
V / μs 
(1) For accurate measurements through the full differential measurement
range, the common mode must be restricted to the Common Mode
Voltage Range (CMVR), a subset of the maximum operating range.
The CMVR equals the maximum operating range minus the configured
differential range; in effect, this reserves half of the differential
input range near each operating range limit.
(2) This injection occurs each time a multiplexer device captures
a new sample.
Assumes a conventional input signal 0 V at 0 Ω.
(3) Assumes proper calibration and environment temperature regulated to
25 °C
(4) Does not cover the settling time that follows a slewing transient.
Dynamic Response Characteristics
Parameter  Sym  Min  Typ  Max  Units 

Range 10V to +10V  
Theoretical quantization noise ^{(1)} 


0.57 

count 
Static ground noise ^{(1) (2)} 

— 
0.58 
— 
count 
Signal to Noise Ratio ^{(3)} 
SNR 
— 
90 
— 
dB 
Total Harmonic Distortion ^{(3)} 
THD 
— 
90 
— 
dB 
Signal to NoiseandDistortion ^{(3)} 
SINAD 
— 
87 
— 
dB 
Effective Number of Bits ^{(3)} 
ENOB 
— 
14.1 
— 
bits 
SpuriousFree Dynamic Range ^{(4)} 
SFDR 
— 
92 
— 
dB 
Nonlinearity Error (Integral Noninearity) 
INL 


1.2 
count 
Common Mode Rejection Ratio at DC 
CMRR_{0} 
— 
98 
— 
dB 
Common Mode Rejection Ratio at 60 Hz 
CMRR_{60} 
— 
92 
— 
dB 
Common Mode Rejection Ratio at 10 kHz 
CMRR_{10k} 
— 
88 
— 
dB 
Range 5V to +5V  
Theoretical quantization noise ^{(1)} 


0.57 

count 
Static ground noise ^{(1) (2)} 

— 
0.60 
— 
count 
Signal to Noise Ratio ^{(3)} 
SNR 
— 
89 
— 
dB 
Total Harmonic Distortion ^{(3)} 
THD 
— 
94 
— 
dB 
Signal to NoiseandDistortion ^{(3)} 
SINAD 
— 
88 
— 
dB 
Effective Number of Bits ^{(3)} 
ENOB 
— 
14.3 
— 
bits 
SpuriousFree Dynamic Range ^{(4)} 
SFDR 
— 
98 
— 
dB 
Nonlinearity Error (Integral Noninearity) 
INL 


1.3 
count 
Common Mode Rejection Ratio at DC 
CMRR_{0} 
— 
103 
— 
dB 
Common Mode Rejection Ratio at 60 Hz 
CMRR_{60} 
— 
92 
— 
dB 
Common Mode Rejection Ratio at 10 kHz 
CMRR_{10k} 
— 
92 
— 
dB 
Range 2V to +2V  
Theoretical quantization noise ^{(1)} 


0.57 

count 
Static ground noise ^{(1) (2)} 

— 
0.70 
— 
count 
Signal to Noise Ratio ^{(3)} 
SNR 
— 
85 
— 
dB 
Total Harmonic Distortion ^{(3)} 
THD 
— 
95 
— 
dB 
Signal to NoiseandDistortion ^{(3)} 
SINAD 
— 
85 
— 
dB 
Effective Number of Bits ^{(3)} 
ENOB 
— 
13.8 
— 
bits 
SpuriousFree Dynamic Range ^{(4)} 
SFDR 
— 
98 
— 
dB 
Nonlinearity Error (Integral Noninearity) 
INL 


1.4 
count 
Common Mode Rejection Ratio at DC 
CMRR_{0} 
— 
110 
— 
dB 
Common Mode Rejection Ratio at 60 Hz 
CMRR_{60} 
— 
92 
— 
dB 
Common Mode Rejection Ratio at 10 kHz 
CMRR_{10k} 
— 
92 
— 
dB 
Range 1V to +1V  
Theoretical quantization noise ^{(1)} 


0.57 

count 
Static ground noise ^{(1) (2)} 

— 
0.91 
— 
count 
Signal to Noise Ratio ^{(3)} 
SNR 
— 
87 
— 
dB 
Total Harmonic Distortion ^{(3)} 
THD 
— 
91 
— 
dB 
Signal to NoiseandDistortion ^{(3)} 
SINAD 
— 
86 
— 
dB 
Effective Number of Bits ^{(3)} 
ENOB 
— 
12.8 
— 
bits 
SpuriousFree Dynamic Range ^{(4)} 
SFDR 
— 
97 
— 
dB 
Nonlinearity Error (Integral Noninearity) 
INL 


1.5 
count 
Common Mode Rejection Ratio at DC 
CMRR_{0} 
— 
110 
— 
dB 
Common Mode Rejection Ratio at 60 Hz 
CMRR_{60} 
— 
92 
— 
dB 
Common Mode Rejection Ratio at 10 kHz 
CMRR_{10k} 
— 
92 
— 
dB 
Range 0.5V to +0.5V  
Theoretical quantization noise ^{(1)} 


0.57 

count 
Static ground noise ^{(1) (2)} 

— 
2.6 
— 
count 
Signal to Noise Ratio ^{(3)} 
SNR 
— 
79 
— 
dB 
Total Harmonic Distortion ^{(3)} 
THD 
— 
91 
— 
dB 
Signal to NoiseandDistortion ^{(3)} 
SINAD 
— 
78 
— 
dB 
Effective Number of Bits ^{(3)} 
ENOB 
— 
12.8 
— 
bits 
SpuriousFree Dynamic Range ^{(4)} 
SFDR 
— 
93 
— 
dB 
Nonlinearity Error (Integral Noninearity) 
INL 


1.6 
count 
Common Mode Rejection Ratio at DC 
CMRR_{0} 
— 
110 
— 
dB 
Common Mode Rejection Ratio at 60 Hz 
CMRR_{60} 
— 
85 
— 
dB 
Common Mode Rejection Ratio at 10 kHz 
CMRR_{10k} 
— 
85 
— 
dB 
Range 0.2V to +0.2V  
Theoretical quantization noise ^{(1)} 


0.57 

count 
Static ground noise ^{(1) (2)} 

— 
4.5 
— 
count 
Signal to Noise Ratio ^{(3)} 
SNR 
— 
74 
— 
dB 
Total Harmonic Distortion ^{(3)} 
THD 
— 
91 
— 
dB 
Signal to NoiseandDistortion ^{(3)} 
SINAD 
— 
74 
— 
dB 
Effective Number of Bits ^{(3)} 
ENOB 
— 
12.1 
— 
bits 
SpuriousFree Dynamic Range ^{(4)} 
SFDR 
— 
86 
— 
dB 
Nonlinearity Error (Integral Noninearity) 
INL 


2.2 
count 
Common Mode Rejection Ratio at DC 
CMRR_{0} 
— 
110 
— 
dB 
Common Mode Rejection Ratio at 60 Hz 
CMRR_{60} 
— 
80 
— 
dB 
Common Mode Rejection Ratio at 10 kHz 
CMRR_{10k} 
— 
80 
— 
dB 
Range 0.1V to +0.1V  
Theoretical quantization noise ^{(1)} 


0.57 

count 
Static ground noise ^{(1) (2)} 

— 
7.6 
— 
count 
Signal to Noise Ratio ^{(3)} 
SNR 
— 
70 
— 
dB 
Total Harmonic Distortion ^{(3)} 
THD 
— 
91 
— 
dB 
Signal to NoiseandDistortion ^{(3)} 
SINAD 
— 
70 
— 
dB 
Effective Number of Bits ^{(3)} 
ENOB 
— 
11.4 
— 
bits 
SpuriousFree Dynamic Range ^{(4)} 
SFDR 
— 
80 
— 
dB 
Nonlinearity Error (Integral Noninearity) 
INL 


2.6 
count 
Common Mode Rejection Ratio at DC 
CMRR_{0} 
— 
110 
— 
dB 
Common Mode Rejection Ratio at 60 Hz 
CMRR_{60} 
— 
76 
— 
dB 
Common Mode Rejection Ratio at 10 kHz 
CMRR_{10k} 
— 
76 
— 
dB 
(1) Noise levels are given as RMS (standard deviation), where one unit corresponds to
one LSB count of the converter.
(2) Quiescent noise is measured with constant input level, nominally held at 0 V
through 0 Ω resistance, ignoring offset.
(3) Repeatability tests use 10 kHz, sinusoidal excitation with amplitude > 0.5 dB
relative to full converter range,
and sampling rate is 2 x 10^{5} samples per second.
(4) Same as repeatability tests but sampling at 1.0 x 10^{6} samples per second.