Data Acquisition (DAQ) and Control from Microstar Laboratories

Overview

 

Processing

 

xDAP Models

 

Pricing Information

 

xDAP 7420

xDAP 7410

xDAP 7400

Features

|

Details

|

Documentation

|

PDF Spec Sheet

|

Terminology

xDAP7410

xDAP 7410 Specifications

Sections: Physical | Processor | Timing | Input | Digital I/O | Input Electrical | Dynamic

Physical Characteristics

Parameter Sym Min Typ Max Units

Enclosure

Length, body

 

 

12.43
(31.6)

 

in
(cm)

Length, body plus handles

 

 

14.25
(36.2)

 

in
(cm)

Width

 

 

9.25
(23.5)

 

in
(cm)

Height, body

 

 

5.25
(13.3)

 

in
(cm)

Height, body plus feet

 

 

5.56
(14.1)

 

in
(cm)

Weight

 

 

11.75
(5.3)

 

lb
(kg)

Operating temperature (1)

Ta

0

50

°C

External AC Power Requirements

Supply input voltage (2)

Vps

100

115
230


240

V RMS
V RMS

Supply input current

Ips

 
 


6
3

A RMS  (115V)
A RMS  (230V)

Supply input power (3)

Pps

10

50

100

W

Supply input frequency (4)

fps

47
57

50
60

53
63

Hz

Internal DC power capacity

Continuous ground current load capacity

 

 

 

100

mA

Fuse rating, +5V supply
Fuse rating, digital gnd
Fuse rating, digital+5V

 
 
 

 
 
 

2
2
2

 
 
 

 
A
 

(1) Presumes adequate ventilation.
(2) The full range from 100 to 240 volts is tested.
(3) Does not include loading from added termination networks or customizations.
(4) Min and max frequency limits are the tested range, nominal value ± 6% tolerance

Processor Module

Feature Property

Processor type

Intel® Celeron 575

Processor clock speed

2.0 GHz

Processor main memory

1.0 GB

Embedded operating system

DAPL 3000

Timing Characteristics

Parameter Sym Min Typ Max Units

Sampling interval resolution

Δts

 

20

 

ns

Sampling interval range

ts

1.0

 

10000.0

μs

Timing absolute accuracy (1)

 

50

50

PPM

Sampling interval jitter

 

100

ps

Acquisition latency (2)

 

900

ns

(1) Oscillator is affected by temperature, supply, and long-term drift variations.
(2) Describes hardware performance only. Buffering, processing, and data transport contribute much larger latencies.

Input Characteristics

Feature Property

Analog input channel type

Differential

Number of analog-to-digital converters (1)

8 (simultaneous)

Maximum multiplexed analog input signals

32

Primary HD connector

16 channels

Optional BNC input panels

8 or 16 channels

Analog-to-digital converter codes

65536 (16 bits)

Skipped or missing codes

none

Skipped or missing samples

none

Configurable input ranges

7

-10 V to +10 V

gain 1

-5 V to +5 V

gain 2

-2 V to +2 V

gain 5

-1 V to +1 V

gain 10

-0.5 V to +0.5 V

gain 20

-0.2 V to +0.2 V

gain 50

-0.1 V to +0.1 V

gain 100

(1) Conversion operations on all converters are clocked simultaneously.

Digital I/O Characteristics

Parameter Sym Min Typ Max Units

Inputs

Absolute input range limits

 

-0.5

 

5.5

V

Operating range

Vi

0.0

 

5.0

V

Input for level-low

ViL

 

 

0.8

V

Input for level-high

ViH

2.0

 

 

V

Input current (1)

Il

-12

12

μA

Input load (1)

Ri
Ci


10
120



pF

Input transition time (2)

Tt

 

 

60

ns

Outputs

Output voltage range

Vo

0

 

3.3

V

Continuous output current

Io

-5

 

5

mA

Output voltage at -5 mA load

VoH

2.4

 

 

V

Output voltage at 5 mA load

VoL

 

 

0.4

V

Output termination (1)

RT

10

Output capacitive load (3)

CL

 

 

200

pF

Unloaded switching transition time

tpd

 

12

ns

Loaded switching transition time (4)

tpdL

 

30

ns

Output voltage source

Output supply voltage

Vss

5.0

V

Regulation under full load

ΔVss

-5

 

+5

%

Supply current

Iss

 

 

0.5

A

Ground sink current

IG

 

 

-0.5

A

(1) The termination resistance is present at all times, and will pull voltages to ground under unpowered conditions.
(2) Signal transitions between ViL and ViH levels can go more slowly, but slower transitions could lead to uncertainty in captured value.
(3) Excessive capacitive loading can degrade device stability.
(4) Includes CL capacitive loading in addition to termination.

Input Electrical Characteristics

Parameter Sym Min Typ Max Units

Input channels

Absolute input range limits

ViMax

-35

 

+35

V

Operating input range limits (1)

Vi

-13

 

+13

V

Input impedance

Ri
Ci

20
50


pF

Input leakage current

IL

5

46

nA

Charge injection (2)

 

0.4

pC

Offset error (3)

 

-2

2

counts

Offset thermal sensitivity

 

μV / °C

Long term offset drift

 

% / yr

Gain error (3)

 

0.05

%

Gain thermal sensitivity

 

% / °C

Long term gain drift

 

% / yr

Slewing rate limit (4)

 

20

V / μs

(1) For accurate measurements through the full differential measurement range, the common mode must be restricted to the Common Mode Voltage Range (CMVR), a subset of the maximum operating range. The CMVR equals the maximum operating range minus the configured differential range; in effect, this reserves half of the differential input range near each operating range limit.
(2) This injection occurs each time a multiplexer device captures a new sample.
Assumes a conventional input signal 0 V at 0 Ω.
(3) Assumes proper calibration and environment temperature regulated to 25 °C
(4) Does not cover the settling time that follows a slewing transient.

Dynamic Response Characteristics

Parameter Sym Min Typ Max Units

Range -10V to +10V

Theoretical quantization noise (1)

 

 

0.57

 

count

Static ground noise (1) (2)

 

0.58

count

Signal to Noise Ratio (3)

SNR

90

dB

Total Harmonic Distortion (3)

THD

-90

dB

Signal to Noise-and-Distortion (3)

SINAD

87

dB

Effective Number of Bits (3)

ENOB

14.1

bits

Spurious-Free Dynamic Range (4)

SFDR

92

dB

Nonlinearity Error (Integral Noninearity)

INL

 

 

1.2

count

Common Mode Rejection Ratio at DC

CMRR0

-98

dB

Common Mode Rejection Ratio at 60 Hz

CMRR60

-92

dB

Common Mode Rejection Ratio at 10 kHz

CMRR10k

-88

dB

Range -5V to +5V

Theoretical quantization noise (1)

 

 

0.57

 

count

Static ground noise (1) (2)

 

0.60

count

Signal to Noise Ratio (3)

SNR

89

dB

Total Harmonic Distortion (3)

THD

-94

dB

Signal to Noise-and-Distortion (3)

SINAD

88

dB

Effective Number of Bits (3)

ENOB

14.3

bits

Spurious-Free Dynamic Range (4)

SFDR

98

dB

Nonlinearity Error (Integral Noninearity)

INL

 

 

1.3

count

Common Mode Rejection Ratio at DC

CMRR0

-103

dB

Common Mode Rejection Ratio at 60 Hz

CMRR60

-92

dB

Common Mode Rejection Ratio at 10 kHz

CMRR10k

-92

dB

Range -2V to +2V

Theoretical quantization noise (1)

 

 

0.57

 

count

Static ground noise (1) (2)

 

0.70

count

Signal to Noise Ratio (3)

SNR

85

dB

Total Harmonic Distortion (3)

THD

-95

dB

Signal to Noise-and-Distortion (3)

SINAD

85

dB

Effective Number of Bits (3)

ENOB

13.8

bits

Spurious-Free Dynamic Range (4)

SFDR

98

dB

Nonlinearity Error (Integral Noninearity)

INL

 

 

1.4

count

Common Mode Rejection Ratio at DC

CMRR0

-110

dB

Common Mode Rejection Ratio at 60 Hz

CMRR60

-92

dB

Common Mode Rejection Ratio at 10 kHz

CMRR10k

-92

dB

Range -1V to +1V

Theoretical quantization noise (1)

 

 

0.57

 

count

Static ground noise (1) (2)

 

0.91

count

Signal to Noise Ratio (3)

SNR

87

dB

Total Harmonic Distortion (3)

THD

-91

dB

Signal to Noise-and-Distortion (3)

SINAD

86

dB

Effective Number of Bits (3)

ENOB

12.8

bits

Spurious-Free Dynamic Range (4)

SFDR

97

dB

Nonlinearity Error (Integral Noninearity)

INL

 

 

1.5

count

Common Mode Rejection Ratio at DC

CMRR0

-110

dB

Common Mode Rejection Ratio at 60 Hz

CMRR60

-92

dB

Common Mode Rejection Ratio at 10 kHz

CMRR10k

-92

dB

Range -0.5V to +0.5V

Theoretical quantization noise (1)

 

 

0.57

 

count

Static ground noise (1) (2)

 

2.6

count

Signal to Noise Ratio (3)

SNR

79

dB

Total Harmonic Distortion (3)

THD

-91

dB

Signal to Noise-and-Distortion (3)

SINAD

78

dB

Effective Number of Bits (3)

ENOB

12.8

bits

Spurious-Free Dynamic Range (4)

SFDR

93

dB

Nonlinearity Error (Integral Noninearity)

INL

 

 

1.6

count

Common Mode Rejection Ratio at DC

CMRR0

-110

dB

Common Mode Rejection Ratio at 60 Hz

CMRR60

-85

dB

Common Mode Rejection Ratio at 10 kHz

CMRR10k

-85

dB

Range -0.2V to +0.2V

Theoretical quantization noise (1)

 

 

0.57

 

count

Static ground noise (1) (2)

 

4.5

count

Signal to Noise Ratio (3)

SNR

74

dB

Total Harmonic Distortion (3)

THD

-91

dB

Signal to Noise-and-Distortion (3)

SINAD

74

dB

Effective Number of Bits (3)

ENOB

12.1

bits

Spurious-Free Dynamic Range (4)

SFDR

86

dB

Nonlinearity Error (Integral Noninearity)

INL

 

 

2.2

count

Common Mode Rejection Ratio at DC

CMRR0

-110

dB

Common Mode Rejection Ratio at 60 Hz

CMRR60

-80

dB

Common Mode Rejection Ratio at 10 kHz

CMRR10k

-80

dB

Range -0.1V to +0.1V

Theoretical quantization noise (1)

 

 

0.57

 

count

Static ground noise (1) (2)

 

7.6

count

Signal to Noise Ratio (3)

SNR

70

dB

Total Harmonic Distortion (3)

THD

-91

dB

Signal to Noise-and-Distortion (3)

SINAD

70

dB

Effective Number of Bits (3)

ENOB

11.4

bits

Spurious-Free Dynamic Range (4)

SFDR

80

dB

Nonlinearity Error (Integral Noninearity)

INL

 

 

2.6

count

Common Mode Rejection Ratio at DC

CMRR0

-110

dB

Common Mode Rejection Ratio at 60 Hz

CMRR60

-76

dB

Common Mode Rejection Ratio at 10 kHz

CMRR10k

-76

dB

(1) Noise levels are given as RMS (standard deviation), where one unit corresponds to one LSB count of the converter.
(2) Quiescent noise is measured with constant input level, nominally held at 0 V through 0 Ω resistance, ignoring offset.
(3) Repeatability tests use 10 kHz, sinusoidal excitation with amplitude > -0.5 dB relative to full converter range,
and sampling rate is 2 x 105 samples per second.
(4) Same as repeatability tests but sampling at 1.0 x 106 samples per second.