Data Acquisition Specifications for xDAP 7410

xDAP 7410 Specifications

Physical Characteristics

Parameter	Sym	Min	Typ	Max	Units
Enclosure
Length, body			12.43 (31.6)		in (cm)
Length, body plus handles			14.25 (36.2)		in (cm)
Width			9.25 (23.5)		in (cm)
Height, body			5.25 (13.3)		in (cm)
Height, body plus feet			5.56 (14.1)		in (cm)
Weight			11.75 (5.3)		lb (kg)
Operating temperature ⁽¹⁾	T_a	0	—	50	°C
External AC Power Requirements
Supply input voltage ⁽²⁾	V_ps	100 —	115 230	— 240	V RMS V RMS
Supply input current	I_ps		— —	6 3	A RMS (115V) A RMS (230V)
Supply input power ⁽³⁾	P_ps	10	50	100	W
Supply input frequency ⁽⁴⁾	f_ps	47 57	50 60	53 63	Hz
Internal DC power capacity
Continuous ground current load capacity				100	mA
Fuse rating, +5V supply Fuse rating, digital gnd Fuse rating, digital+5V			2 2 2		A

(1) Presumes adequate ventilation.
(2) The full range from 100 to 240 volts is tested.
(3) Does not include loading from added termination networks or customizations.
(4) Min and max frequency limits are the tested range, nominal value ± 6% tolerance

Processor Module

Feature	Property
Processor type	Intel® Celeron 575
Processor clock speed	2.0 GHz
Processor main memory	1.0 GB
Embedded operating system	DAPL 3000

Timing Characteristics

Parameter	Sym	Min	Typ	Max	Units
Sampling interval resolution	Δt_s		20		ns
Sampling interval range	t_s	1.0		10000.0	μs
Timing absolute accuracy ⁽¹⁾		50	—	50	PPM
Sampling interval jitter		—	100	—	ps
Acquisition latency ⁽²⁾		—	—	900	ns

(1) Oscillator is affected by temperature, supply, and long-term drift variations.
(2) Describes hardware performance only. Buffering, processing, and data transport contribute much larger latencies.

Input Characteristics

Feature	Property
Analog input channel type	Differential
Number of analog-to-digital converters ⁽¹⁾	8 (simultaneous)
Maximum multiplexed analog input signals	32
Primary HD connector	16 channels
Optional BNC input panels	8 or 16 channels
Analog-to-digital converter codes	65536 (16 bits)
Skipped or missing codes	none
Skipped or missing samples	none
Configurable input ranges	7
-10 V to +10 V	gain 1
-5 V to +5 V	gain 2
-2 V to +2 V	gain 5
-1 V to +1 V	gain 10
-0.5 V to +0.5 V	gain 20
-0.2 V to +0.2 V	gain 50
-0.1 V to +0.1 V	gain 100

(1) Conversion operations on all converters are clocked simultaneously.

Digital I/O Characteristics

Parameter	Sym	Min	Typ	Max	Units
Inputs
Absolute input range limits		-0.5		5.5	V
Operating range	V_i	0.0		5.0	V
Input for level-low	V_iL			0.8	V
Input for level-high	V_iH	2.0			V
Input current ⁽¹⁾	I_l	-12	—	12	μA
Input load ⁽¹⁾	R_i C_i	— —	10 120	— —	kΩ pF
Input transition time ⁽²⁾	T_t			60	ns
Outputs
Output voltage range	V_o	0		3.3	V
Continuous output current	I_o	-5		5	mA
Output voltage at -5 mA load	V_oH	2.4			V
Output voltage at 5 mA load	V_oL			0.4	V
Output termination ⁽¹⁾	R_T	—	10	—	kΩ
Output capacitive load ⁽³⁾	C_L			200	pF
Unloaded switching transition time	t_pd		12	—	ns
Loaded switching transition time ⁽⁴⁾	t_pdL		30	—	ns
Output voltage source
Output supply voltage	V_ss	—	5.0	—	V
Regulation under full load	ΔV_ss	-5		+5	%
Supply current	I_ss			0.5	A
Ground sink current	I_G			-0.5	A

(1) The termination resistance is present at all times, and will pull voltages to ground under unpowered conditions.
(2) Signal transitions between V_iL and V_iH levels can go more slowly, but slower transitions could lead to uncertainty in captured value.
(3) Excessive capacitive loading can degrade device stability.
(4) Includes C_L capacitive loading in addition to termination.

Input Electrical Characteristics

Parameter	Sym	Min	Typ	Max	Units
Input channels
Absolute input range limits	V_iMax	-35		+35	V
Operating input range limits ⁽¹⁾	V_i	-13		+13	V
Input impedance	R_i C_i	—	20 50	—	MΩ pF
Input leakage current	I_L	—	5	46	nA
Charge injection ⁽²⁾		—	0.4	—	pC
Offset error ⁽³⁾		-2	—	2	counts
Offset thermal sensitivity		—	—	—	μV / °C
Long term offset drift		—	—	—	% / yr
Gain error ⁽³⁾		—	—	0.05	%
Gain thermal sensitivity		—	—	—	% / °C
Long term gain drift		—	—	—	% / yr
Slewing rate limit ⁽⁴⁾		—	20	—	V / μs

(1) For accurate measurements through the full differential measurement range, the common mode must be restricted to the Common Mode Voltage Range (CMVR), a subset of the maximum operating range. The CMVR equals the maximum operating range minus the configured differential range; in effect, this reserves half of the differential input range near each operating range limit.
(2) This injection occurs each time a multiplexer device captures a new sample.
Assumes a conventional input signal 0 V at 0 Ω.
(3) Assumes proper calibration and environment temperature regulated to 25 °C
(4) Does not cover the settling time that follows a slewing transient.

Dynamic Response Characteristics

Parameter	Sym	Min	Typ	Max	Units
Range -10V to +10V
Theoretical quantization noise ⁽¹⁾			0.57		count
Static ground noise ^{(1) (2)}		—	0.58	—	count
Signal to Noise Ratio ⁽³⁾	SNR	—	90	—	dB
Total Harmonic Distortion ⁽³⁾	THD	—	-90	—	dB
Signal to Noise-and-Distortion ⁽³⁾	SINAD	—	87	—	dB
Effective Number of Bits ⁽³⁾	ENOB	—	14.1	—	bits
Spurious-Free Dynamic Range ⁽⁴⁾	SFDR	—	92	—	dB
Nonlinearity Error (Integral Noninearity)	INL			1.2	count
Common Mode Rejection Ratio at DC	CMRR₀	—	-98	—	dB
Common Mode Rejection Ratio at 60 Hz	CMRR₆₀	—	-92	—	dB
Common Mode Rejection Ratio at 10 kHz	CMRR_10k	—	-88	—	dB
Range -5V to +5V
Theoretical quantization noise ⁽¹⁾			0.57		count
Static ground noise ^{(1) (2)}		—	0.60	—	count
Signal to Noise Ratio ⁽³⁾	SNR	—	89	—	dB
Total Harmonic Distortion ⁽³⁾	THD	—	-94	—	dB
Signal to Noise-and-Distortion ⁽³⁾	SINAD	—	88	—	dB
Effective Number of Bits ⁽³⁾	ENOB	—	14.3	—	bits
Spurious-Free Dynamic Range ⁽⁴⁾	SFDR	—	98	—	dB
Nonlinearity Error (Integral Noninearity)	INL			1.3	count
Common Mode Rejection Ratio at DC	CMRR₀	—	-103	—	dB
Common Mode Rejection Ratio at 60 Hz	CMRR₆₀	—	-92	—	dB
Common Mode Rejection Ratio at 10 kHz	CMRR_10k	—	-92	—	dB
Range -2V to +2V
Theoretical quantization noise ⁽¹⁾			0.57		count
Static ground noise ^{(1) (2)}		—	0.70	—	count
Signal to Noise Ratio ⁽³⁾	SNR	—	85	—	dB
Total Harmonic Distortion ⁽³⁾	THD	—	-95	—	dB
Signal to Noise-and-Distortion ⁽³⁾	SINAD	—	85	—	dB
Effective Number of Bits ⁽³⁾	ENOB	—	13.8	—	bits
Spurious-Free Dynamic Range ⁽⁴⁾	SFDR	—	98	—	dB
Nonlinearity Error (Integral Noninearity)	INL			1.4	count
Common Mode Rejection Ratio at DC	CMRR₀	—	-110	—	dB
Common Mode Rejection Ratio at 60 Hz	CMRR₆₀	—	-92	—	dB
Common Mode Rejection Ratio at 10 kHz	CMRR_10k	—	-92	—	dB
Range -1V to +1V
Theoretical quantization noise ⁽¹⁾			0.57		count
Static ground noise ^{(1) (2)}		—	0.91	—	count
Signal to Noise Ratio ⁽³⁾	SNR	—	87	—	dB
Total Harmonic Distortion ⁽³⁾	THD	—	-91	—	dB
Signal to Noise-and-Distortion ⁽³⁾	SINAD	—	86	—	dB
Effective Number of Bits ⁽³⁾	ENOB	—	12.8	—	bits
Spurious-Free Dynamic Range ⁽⁴⁾	SFDR	—	97	—	dB
Nonlinearity Error (Integral Noninearity)	INL			1.5	count
Common Mode Rejection Ratio at DC	CMRR₀	—	-110	—	dB
Common Mode Rejection Ratio at 60 Hz	CMRR₆₀	—	-92	—	dB
Common Mode Rejection Ratio at 10 kHz	CMRR_10k	—	-92	—	dB
Range -0.5V to +0.5V
Theoretical quantization noise ⁽¹⁾			0.57		count
Static ground noise ^{(1) (2)}		—	2.6	—	count
Signal to Noise Ratio ⁽³⁾	SNR	—	79	—	dB
Total Harmonic Distortion ⁽³⁾	THD	—	-91	—	dB
Signal to Noise-and-Distortion ⁽³⁾	SINAD	—	78	—	dB
Effective Number of Bits ⁽³⁾	ENOB	—	12.8	—	bits
Spurious-Free Dynamic Range ⁽⁴⁾	SFDR	—	93	—	dB
Nonlinearity Error (Integral Noninearity)	INL			1.6	count
Common Mode Rejection Ratio at DC	CMRR₀	—	-110	—	dB
Common Mode Rejection Ratio at 60 Hz	CMRR₆₀	—	-85	—	dB
Common Mode Rejection Ratio at 10 kHz	CMRR_10k	—	-85	—	dB
Range -0.2V to +0.2V
Theoretical quantization noise ⁽¹⁾			0.57		count
Static ground noise ^{(1) (2)}		—	4.5	—	count
Signal to Noise Ratio ⁽³⁾	SNR	—	74	—	dB
Total Harmonic Distortion ⁽³⁾	THD	—	-91	—	dB
Signal to Noise-and-Distortion ⁽³⁾	SINAD	—	74	—	dB
Effective Number of Bits ⁽³⁾	ENOB	—	12.1	—	bits
Spurious-Free Dynamic Range ⁽⁴⁾	SFDR	—	86	—	dB
Nonlinearity Error (Integral Noninearity)	INL			2.2	count
Common Mode Rejection Ratio at DC	CMRR₀	—	-110	—	dB
Common Mode Rejection Ratio at 60 Hz	CMRR₆₀	—	-80	—	dB
Common Mode Rejection Ratio at 10 kHz	CMRR_10k	—	-80	—	dB
Range -0.1V to +0.1V
Theoretical quantization noise ⁽¹⁾			0.57		count
Static ground noise ^{(1) (2)}		—	7.6	—	count
Signal to Noise Ratio ⁽³⁾	SNR	—	70	—	dB
Total Harmonic Distortion ⁽³⁾	THD	—	-91	—	dB
Signal to Noise-and-Distortion ⁽³⁾	SINAD	—	70	—	dB
Effective Number of Bits ⁽³⁾	ENOB	—	11.4	—	bits
Spurious-Free Dynamic Range ⁽⁴⁾	SFDR	—	80	—	dB
Nonlinearity Error (Integral Noninearity)	INL			2.6	count
Common Mode Rejection Ratio at DC	CMRR₀	—	-110	—	dB
Common Mode Rejection Ratio at 60 Hz	CMRR₆₀	—	-76	—	dB
Common Mode Rejection Ratio at 10 kHz	CMRR_10k	—	-76	—	dB

(1) Noise levels are given as RMS (standard deviation), where one unit corresponds to one LSB count of the converter.
(2) Quiescent noise is measured with constant input level, nominally held at 0 V through 0 Ω resistance, ignoring offset.
(3) Repeatability tests use 10 kHz, sinusoidal excitation with amplitude > -0.5 dB relative to full converter range,
and sampling rate is 2 x 10⁵ samples per second.
(4) Same as repeatability tests but sampling at 1.0 x 10⁶ samples per second.